Impact of parametric mismatch and fluctuations on performance and yield of deep submicron CMOS technologies
gives an overview of the de- velopment of the threshold voltage mismatch
A∆VT factors for long n-channel MOS- FETs in submicron CMOS process generations. … indicate
performance dif- ferences between several process flavours of the same technology
Impact of parametric mismatch and fluctuations on performance and yield of deep submicron CMOS technologies